Scientists from the Centre for Crop and Disease Management (CCDM) and Curtin University in Western Australia have used an advanced imaging technique at the Australian Synchrotron for an in-depth look at how a fungus found in wheat crops is damaging its leaves.
Prof Mark Gibberd, director of the Centre, said the investigation was thought to be one of the first that utilised high-resolution X-ray imaging to examine biotic stress related to fungal infection in wheat.
Using X-ray fluorescence microscopy (XFM) on leaf samples collected from wheat plants, the team, which included project leader Dr Fatima Naim and ARC Future Fellow Dr Mark Hackett, mapped specific elements in the leaves in and around points of infection.
“Our research project looks at the physiological impact of plant diseases, such as yellow spot, on the function of leaves” said Gibberd.
Yellow spot is a ubiquitous fungal disease caused by Pyrenophora tritici-repentis (Ptr). It can reduce grain yields by up to 20 per cent – a significant amount which could be the difference between a profitable and non-profitable crop for a farmer.
In Australia, it is one of the most costly diseases to the wheat industry, with wheat yield losses due to yellow spot estimated at over $210 million per year.
>Read more on the Autralisan Synchrotron at ANSTO website
Image: FM image reveals elements present in yellow spot fungs and the wheat leaves.
Credit: Curtin University