The aim of the course is to train participants in various X-ray diffraction methods that they can apply them in their current scientific project. The school will focus on phase analysis applying crystallographic databases, crystal structure analysis at ambient and non-ambient conditions. Thin film analysis like depth profiling, reflectivity, texture, and epitaxy will be introduced as well.
As an outcome from the first X-ray school we expanded the 2nd school to have more time for general introduction and hands-on experiments as well as for detailed evaluation and discussions. For effectiveness, the school will be offered in the way of modules. It will start with a mandatory general module. Afterwards the school will be split into a powder diffraction and a thin film analysis module which separately or both can be attended.