Conferences

Upcoming Conferences:

XTOP 2026 – 16th Conference on High-Resolution X-ray Diffraction and Imaging

2026/09/21
till 2026/09/25
All-day event
Location: Karlsruhe, Germany

XTOP 2026 brings together scientists working in X-ray diffractometry and reflectometry, coherent and conventional X-ray diffraction imaging and topography, as well as 2D and 3D X-ray imaging using phase contrast and complementary contrast mechanisms. The conference is a leading forum for laboratory- and synchrotron-based methods, instrumentation, and applications.

Important dates:

  • Opening date for submission of abstracts: 31 March 2026
  • Deadline for submission of abstracts: 11 May 2026
  • Early-bird registration deadline: 14 June 2026
  • Deadline for late registration: 20 August 2026

XAFS50.FR conference

2026/10/05
till 2026/10/09
All-day event
Location: Synchrotron SOLEIL, Saint-Aubin, France

50 Years of XAFS Adventure in France: From the Pioneers of LURE to 4th-Generation Sources

The XAFS50.FR conference will take place at SOLEIL from October 5 to 9, 2026.

How can we observe the environment around atoms ? Over the past 50 years, XAFS (X-ray Absorption Fine Structure) spectroscopy has attracted researchers from every field thanks to its atomic and orbital selectivity combined with high sensitivity, offering unique access to the structural and electronic properties of materials.

Developed in parallel with major advances in synchrotron radiation, XAFS has established itself step by step, becoming an essential tool for many scientific communities as well as for industry, and is now even beginning to appear as a laboratory-based technique with commercial spectrometers.

The XAFS50.FR event will bring together historical insight and scientific perspectives, highlighting the pioneering experiments carried out at LURE (ACO, DCI, Super-ACO), the development of formalisms and the standardization of analyses, and the current progress at SOLEIL and the 4th generation source ESRF-EBS — a development that SOLEIL-II will soon join.