PSI researchers are first to transfer state-of-the-art microscopy method to X-ray imaging
X-rays provide unique insights into the interior of materials, tissues, and cells. Researchers at the Paul Scherrer Institute PSI have developed a new method that makes X-ray images even better: The resolution is higher and allows more precise inferences about the properties of materials. To accomplish this, the researchers moved the lens of an X-ray microscope and recorded a number of individual images to generate, with the help of computer algorithms, the actual picture. In doing so they have, for the first time ever, transferred the principle of so-called Fourier ptychography to X-ray measurements. The results of their work, carried out at the Swiss Light Source SLS, are published in the journal Science Advances.
Image: Klaus Wakonig and Ana Diaz, together with other PSI researchers, have transferred the principle of Fourier ptychography to X-ray microscopy for the first time ever.
Credit: Paul Scherrer Institute/Markus Fischer