XEOL is an X-ray photon in/optical photon out technique that is related to the conversion of the X-ray energy absorbed by the materials to optical photons, involving multi-step energy transfer cascade processes. XEOL is often used together with XANES to reveal the electronic structure and optical properties of the system of interest, such as rare earth down conversion phosphors, quantum confined semiconductors, heterogeneous materials etc., and is applied in display/lighting technologies (TV, smartphone and LED lamps), scintillators, rechargeable batteries and energy conversion devices (photovoltaic cells). XEOL is now available at the end station of BM-08 XAFS/XRF beamline with emission spectra measurement capability under irradiation with X-ray beam.
Read more in SESAME website
Image: General view of the XEOL experimental setup at BM-08 XAFS/XRF beamline. Sample environment with optical fiber for collecting the luminescence signals