…for nano-scale vibrational spectroscopy. First experimental report of a special optical layout dedicated to correct typical aberrations derived from large extraction ports in IR beamlines.
Infrared nanospectroscopy represents a major breakthrough in chemical analysis since it allows the identification of nanomaterials via their natural (label free) vibrational signatures. Classically powered by laser sources, the experiment called scattering Scanning Near-field Optical Microscopy (s-SNOM) has become a standard tool for investigations of chemical and optical properties of materials beyond the diffraction limit of light.
Lately, s-SNOM is achieving unprecedent sensitivity range by exploring the outstanding spectral irradiance of synchrotron light sources in the full range of infrared (IR) radiation. In the last few years, the combination of s-SNOM and ultra-broadband IR synchrotron (SINS or nano-FTIR) has helped studies in relevant scientific fronts involving atomic layered materials, fundamental optics, nanostructured bio-materials and, very recently, it was demonstrated to be feasible to work in the far-IR.
IR ports in synchrotron storage rings can be up to a thousand times more brilliant than classical IR black body sources. This advantage allowed IR beamlines to be the only places capable of performing IR micro-spectroscopy for many years. However, in comparison to X-ray ports, IR beamlines require large apertures for allowing long wavelengths to be extracted. Consequently, IR beamlines typically present optical aberrations such as extended source depth and coma.
Images (extracts): Figure 1 – Proposed optical layout, IR extraction chamber indicating the source depth, conical mirror illustration, aberration-corrected focal spot at the sample stage and nano-FTIR experimental scheme in operation in the IR endstation of the LNLS. Figure adapted from R. Freitas et al., Optics Express 26, 11238 (2018).