Argonne scientists fashion new class of X-ray detector

The original Argonne press release by Jared Sagoff can be read here.

Getting an X-ray at the dentist or the doctor is at best a little inconvenient and at worst a little risky, as radiation exposure has been linked to an increased risk of cancer. But researchers may have discovered a new way to generate precise X-ray images with a lower amount of exposure, thanks to an exciting set of materials that is generating a lot of interest.

Scientists at the U.S. Department of Energy’s (DOE) Argonne National Laboratory and Los Alamos National Laboratory have identified a new class of X-ray detectors based on layered perovskites, a semiconducting material also used in some other types of applications such as solar cells and light-emitting diodes. The detector with the new material is 100 times more sensitive than conventional, silicon-based X-ray detectors.

>Read more on the Advanced Photon Source website.

Image: Two-dimensional (2D) Ruddlesden-Popper phase layered perovskites (BA)2(MA)2Pb3I10 with three layers of inorganic octahedral slab and bulky organics as spacers.

Credit: Image by Dave Tsai/Los Alamos.