New NSLS-II beamline illuminates electronic structures

MIT scientists conduct the first experiment at NSLS-II’s Soft Inelastic X-ray Scattering beamline.

On July 15, 2018, the Soft Inelastic X-ray Scattering (SIX) beamline at the National Synchrotron Light Source II (NSLS-II)—a U.S. Department of Energy (DOE) Office of Science User Facility at DOE’s Brookhaven National Laboratory—welcomed its first visiting researchers. SIX is an experimental station designed to measure the electronic properties of solid materials using ultrabright x-rays. The materials can be as small as a few microns—one millionth of a meter.
The first researchers to take advantage of the world-class capabilities at SIX were Jonathan Pelliciari and Zhihai Zhu, two scientists from the Massachusetts Institute of Technology (MIT). The pair used SIX to study a chromate sample, a fascinating material with novel applications in magnetism, batteries, and catalysis. Little was known about the electronic structure of the chromate sample the MIT team studied at SIX, and their research is aimed at unlocking the properties of this material. To do so, they needed the atomic sensitivity and energy resolution of the SIX beamline.

>Read more on the NSLS-II at Brookhaven National Laboratoy website

Picture: The sample chamber of the Soft Inelastic X-ray Scattering (SIX) beamline at NSLS-II allows scientists to mount their materials on a special holder that can be turned and moved into the beam of bright x-rays.